Web1IONTOF GmbH, Münster, Nordrhein-Westfalen, Germany, 2IONTOF USA, Inc., Chestnut Ridge, New York, United States Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is known to be an extremely surface sensitive analytical technique. It provides detailed elemental and molecular information about surfaces, Web2 [email protected] February 2016 • Vacuum Technology & Coating A group of us recently traveled to Münster, Germany to the headquarters of IONTOF, a leading manufactur-er of time-of-flight ...
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WebCareer Forum IONTOF - Jobs at TOF-SIMS (time of flight secondary ion mass spectrometry), LEIS (low energy ion scattering), surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis Webm6 是 iontof 在 tofsims 5 基础上开发的最新一代高端 tof-sims 仪器,对一次离子源(lmig)和质量分析器(tof analyser)进行了突破性的改进。此外,在硬件方面还增加了 ms/ms 功能选项,重新设计了加热和冷却系统;在软件方面新增了多元统计分析(mvsa)软件包。其设计保证了 sims 应用在所有领域的卓越 ... crypto prices shiba inu
IONTOFジャパン株式会社(神奈川県横浜市緑区)の企業詳細(旧:ENCL株式会社…
WebIONTOF Japan: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company … WebIONTOF Japan: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company … WebTalos F200X G2 透射电子显微镜 Thermo Scientific Talos F200X STEM 是一款扫描透射电子显微镜,其将出色的高分辨率 STEM 和 TEM 成像与业界领先的 能量色散 X 射线光谱 (EDS) 信号检测相结合。 采用构合映射的 2D/3D 化学表征由具有独特清洁度的 4 个柱内 SDD Super-X 探头执行。 Talos F200X 扫描透射电子显微镜在所有维度下均可实现极快速精准 … cryptxxx ransomware